Title :
A Self Calibration Technique for Redundant A/d Converters Providing 16b Accuracy
Author_Institution :
Siemens, Microelectronics, Villach, Austria
Keywords :
CMOS technology; Calibration; Capacitance; Capacitors; Circuit testing; Error correction; Linearity; Microelectronics; Redundancy; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1988.663699
