System on module total ionizing dose distribution modeling

Author

Akhmetov, Alexey O. ; Boychenko, Dmitry V. ; Bobrovskiy, D.V. ; Chumakov, Alexander I. ; Kalashnikov, O.A. ; Nikiforov, Alexander Y. ; Nekrasov, Pavel V.

Author_Institution

Nat. Res. Nucl. Univ., Moscow, Russia

fYear

2014

fDate

12-14 May 2014

Firstpage

329

Lastpage

331

Abstract

The paper presents total ionizing dose (TID) distribution due to trapped electrons and protons at the system on module (SOM) surface. TID calculation was made in 3D_SPACE software (Specialized Electronic Systems). The main goal of this paper is a more precise definition of the radiation hardness requirements for space electronics. A huge TID level dispersion for different ICs in SOM is demonstrated. Basic Al sphere approach for TID spacecraft requirements calculations is shown to provide overestimated conservative results.

Keywords

aluminium; radiation hardening (electronics); space vehicles; 3D_SPACE software; Al; Al sphere; SOM surface; TID distribution; TID level dispersion; TID spacecraft requirements; module total ionizing dose distribution; radiation hardness; space electronics; specialized electronic systems; system on module surface; trapped electrons; trapped protons; Orbits; Protons; Satellites; Software; Solid modeling; Space vehicles; Three-dimensional displays;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on

Conference_Location

Belgrade

Print_ISBN

978-1-4799-5295-3

Type

conf

DOI

10.1109/MIEL.2014.6842156

Filename

6842156