• DocumentCode
    1638090
  • Title

    A research on the fast correlation-based background calibration techniques for the pipeline ADCs

  • Author

    Liang Shang-Quan ; Yin Yong-Sheng ; Deng Hong-Hui ; Zhang Rui ; Hu Jun

  • Author_Institution
    Inst. of VLSI Design, Hefei Univ. of Technol., Hefei, China
  • fYear
    2010
  • Firstpage
    430
  • Lastpage
    432
  • Abstract
    The problem of slow convergence speed exists in the correlation-based digital background calibration techniques for the pipeline ADC. The proposed improved techniques reduce the signal-dependent interference amplitude by clipping MSBs off the ADC output. Meanwhile, the exponential averager is introduced into the LMS iteration. These means can not only calibrate capacitors mismatch in MDACs and the finite gain and bandwidth of the interstage opamp, but also converge more than 20 times faster than normal correlation-based calibration techniques. A behavioral model of 12bits pipeline ADC with 2% interstage gain error in the first stage is presented to verify the efficiency of the calibration techniques. With calibration, simulation results show that SFDR enhances from 69dB to 98dB and SNDR enhances from 53.8dB to 73.5dB.
  • Keywords
    analogue-digital conversion; calibration; convergence; correlation methods; interference (signal); iterative methods; least mean squares methods; operational amplifiers; ADC output; LMS iteration; MDAC; SFDR; SNDR; bandwidth; calibrate capacitors mismatch; clipping MSB; correlation-based background calibration techniques; correlation-based digital background calibration techniques; exponential averager; finite gain; interstage opamp; normal correlation-based calibration techniques; pipeline ADC; signal-dependent interference amplitude; slow convergence speed; Accuracy; Calibration; Convergence; Interference; Least squares approximation; Pipelines; Random sequences;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-5797-7
  • Type

    conf

  • DOI
    10.1109/ICSICT.2010.5667685
  • Filename
    5667685