Title :
Cascode cell analysis for ultra-broadband GaAs MMIC component design applications
Author :
Shinghal, Priya ; Duff, Christopher I. ; Sloan, R. ; Cochran, Sandy
Author_Institution :
MACS Res. Group, Univ. of Manchester, Manchester, UK
Abstract :
Analysis and comparison of MMIC cascode cells is presented. The cascode employs the WIN Foundry PP10-10 0.1μm gate length, 2 mil AlGaAs/InGaAs pHEMT process in common-source and common-gate configurations. On-wafer s-parameter measurements are performed in the frequency range of 0.045 GHz-110 GHz for cascode and device pull-out data. Comparison of measured data is made with s-parameter simulation data obtained using the WIN Process Design Kit (PDK) in common-source & common-gate device configurations and Electromagnetic (EM) simulated data for the passives surrounding the cascode devices. The comparison of simulated & measured s-parameters investigates a 3 dB difference in gain and differing return losses. This work highlights the need for high frequency empirical device models for cascode cells, in particular a common-gate device model extraction including higher frequency parasitics, for implementation in mm-wave cascode designs.
Keywords :
III-V semiconductors; S-parameters; aluminium compounds; field effect MIMIC; field effect MMIC; gallium arsenide; high electron mobility transistors; indium compounds; microwave field effect transistors; millimetre wave field effect transistors; AlGaAs-InGaAs; AlGaAs/InGaAs pHEMT process; WIN Foundry PP10-10; WIN Process Design Kit; cascode cell analysis; common-gate configurations; common-source configurations; electromagnetic simulated data; frequency 0.045 GHz to 110 GHz; mm-wave cascode designs; on-wafer s-parameter measurements; size 0.1 mum; ultra-broadband GaAs MMIC component design applications; Data models; Frequency measurement; Integrated circuit modeling; Loss measurement; MMICs; PHEMTs; Semiconductor device measurement; Cascode; Common gate; Common source; MMIC; Ultra-broadband; pHEMT;
Conference_Titel :
Microwave and RF Conference, 2013 IEEE MTT-S International
Conference_Location :
New Delhi
DOI :
10.1109/IMaRC.2013.6777735