DocumentCode
1638251
Title
Fault diagnosis and repair of SoC memory
Author
Litvinova, Eugenia ; Mostovaya, Karina ; Krasnoyarujskaya, Karina
fYear
2008
Firstpage
635
Lastpage
639
Abstract
Memory repair method by means of spares that enables to cover faulty cells by minimal quantity of reserved components was represented. It enables to increase yield rate (by 5-10 %) by means of repair of faulty silicon crystals on the manufacturing stage, as well as to increase life cycle time of silicon crystals during operation phase.
Keywords
embedded systems; fault diagnosis; system-on-chip; SoC memory repair; fault diagnosis; silicon crystals; Built-In Repair Analysis; Fault Diagnosis; Memory repair;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2008 Proceedings of International Conference on
Conference_Location
Lviv-Slavsko
Print_ISBN
978-966-553-678-9
Type
conf
Filename
5423462
Link To Document