Title :
Degradation defection methods for electronic circuits
Author :
Inujima, Hiroshi
Author_Institution :
Mitsubushi Electr. Corp., Hyogo, Japan
Abstract :
A degradation diagnosis method that detects the degradation symptoms of electronic cards earlier and with higher sensitivity than previous techniques is presented. One type of degraded IC is obtained experimentally by applying a low surge voltage. For the case of the op-amps, there exists a quantitative relation between the degradation of the IC predicted from the increasing off-set current and the correlation with output noise. The root-mean-square value of the noise is an effective index of degradation detection. A method based on a measurement of the minimum value of supply voltage necessary to maintain the correct logical operation is effective in detecting degraded TTLs. An automatic instrument for degradation detection of electronic cards is developed, and its effectiveness is verified
Keywords :
automatic test equipment; fault location; integrated circuit testing; monolithic integrated circuits; transistor-transistor logic; IC testing; TTL; automatic test equipment; degradation diagnosis; electronic card testing; output noise; surge voltage; Control systems; Degradation; Electronic circuits; Electronic components; Industrial electronics; Job shop scheduling; Laboratories; Printed circuits; Production facilities; Switches;
Conference_Titel :
Industrial Electronics Society, 1990. IECON '90., 16th Annual Conference of IEEE
Conference_Location :
Pacific Grove, CA
Print_ISBN :
0-87942-600-4
DOI :
10.1109/IECON.1990.149216