DocumentCode
1638410
Title
An Experimental 16mb Dram with Transposed Data-Line Structure
Author
Aoki, M. ; Nakagome, Y. ; Horiguchi, M. ; Ikenaga, S. ; Etoh, J. ; Kawamoto, Y. ; Kimura, S. ; Takeda, E. ; Sunami, H. ; Itoh, Kenji ; Tanaka, H.
Author_Institution
Hitachi Central Research Laboratory, Tokyo, Japan
fYear
1988
Firstpage
250
Keywords
Capacitance; Circuit noise; Integrated circuit noise; Interference; Noise cancellation; Noise figure; Noise generators; Random access memory; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1988.663714
Filename
663714
Link To Document