Title :
A necessary and sufficient condition for the testability of hybrid circuits
Author :
Liu, R. ; Tong, L. ; Zhang, L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Notre Dame Univ., IN, USA
Abstract :
A unified theory of testing for general systems in a system theoretic setting is presented. It can be applied to digital, analog, and analog/digital hybrid systems. The theory is compared with known results for the classical and nonclassical faults of logic circuits. In the latter case, a maximum length for the test sequences is given for the general case of nonclassical faults. An illustrative example of a nonlinear analog/digital hybrid system is presented
Keywords :
logic testing; nonlinear systems; analog hybrid systems; analog/digital hybrid systems; classical logic circuit faults; digital hybrid systems; general systems; hybrid circuit testability; necessary condition; nonclassical logic circuit faults; sufficient condition; system theoretic setting; test sequence length; testing unified theory; Circuit faults; Circuit testing; Digital systems; Equations; Hybrid power systems; Logic circuits; Logic testing; State-space methods; Sufficient conditions; System testing;
Conference_Titel :
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location :
Portland, OR
DOI :
10.1109/ISCAS.1989.100483
