Title :
Diagnostics based on faulty signature
Author :
Chan, John C. ; Womack, Baxter
Author_Institution :
IBM Corp., Austin, TX, USA
Abstract :
A fault diagnostic algorithm which makes use of the information from a faulty signature is presented. The idea is to search the likely fault locations before the tests are performed. The method reduces the number of tests required to diagnose the faults with the probability of error aliasing. Such probability is always smaller than that of error detection in signature analysis. When matching tests are difficult or impossible, the method provides an estimate of where errors that caused the incorrect signature might have occurred
Keywords :
fault location; integrated circuit testing; logic testing; probability; IC testing; error aliasing; error detection; fault diagnostic algorithm; fault locations; faulty signature; logic testing; probability; signature analysis; Circuit faults; Circuit testing; Fault diagnosis; Fault location; Functional analysis; Information analysis; Input variables; Performance evaluation; Polynomials; Signal generators;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82387
