DocumentCode
1638801
Title
Improved waveform-relaxation-Newton method [MOS circuit testing]
Author
Klaassen, Bernhard ; Paap, Karl L. ; Ploeger, Paul G.
Author_Institution
Gesellschaft fuer Math. und Datenverarbeitung, St. Augustin, West Germany
fYear
1989
Firstpage
856
Abstract
After introducing the waveform relaxation (WR) concept, the authors briefly describe how WR was implemented in the simulator SISAL. They analyze a refinement of WR called waveform relaxation Newton (WRN). They reveal the interrelation of both methods and introduce an improved implementation technique of the WRN algorithm. Numerical results are reported
Keywords
MOS integrated circuits; circuit analysis computing; integrated circuit testing; transient response; waveform analysis; IC testing; MOS circuits; SISAL simulator; improved implementation technique; transient analysis; waveform relaxation refinement; waveform-relaxation-Newton algorithm; waveform-relaxation-Newton method; Boolean functions; Circuit testing; Digital circuits; Feedback loop; Frequency; Gaussian processes; Hardware; Logic circuits; Nonlinear equations; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location
Portland, OR
Type
conf
DOI
10.1109/ISCAS.1989.100486
Filename
100486
Link To Document