DocumentCode :
1639327
Title :
Study and design on high reliability mass capacity memory
Author :
Jianzhong, Tian ; Qinglin, Qiu ; Feng, Ba ; Jinye, Rong ; Yongxiang, Zhang
Author_Institution :
Inf. Eng. Coll., Capital Normal Univ., Beijing, China
fYear :
2010
Firstpage :
701
Lastpage :
704
Abstract :
With the characters of deep storage destiny and high storage speed, the mass capacity memory based on NAND FLASH is widely used in space storage fields. However, due to a variety of condition constrain and bad blocks can be produced, so the reliability of mass capacity storage can not be assured especially in severe environment. A new design plan is proposed to realize the high reliability mass capacity memory. The core technology are triplication redundancy reading and writing of key data through SRAM, warm standby of FLASH arrays, checking of data playback and reasonable bad block management.
Keywords :
SRAM chips; flash memories; storage management; Flash arrays; NAND Flash; SRAM; bad block management; data playback checking; mass capacity memory; space storage fields; static random access memory; Flash memory; Memory management; Radiation detectors; Random access memory; Redundancy; Watches; high reliability; mass capacity; memory; redundancy and fault-tolerance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering and Service Sciences (ICSESS), 2010 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-6054-0
Type :
conf
DOI :
10.1109/ICSESS.2010.5552455
Filename :
5552455
Link To Document :
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