DocumentCode
1639559
Title
How much fault coverage is enough?
Author
Henshaw, Boyd
Author_Institution
NCR Corp., Wichita, KS, USA
fYear
1989
Firstpage
939
Abstract
The author shows how to determine the stuck-fault coverage requirement for an application-specific integrated circuit (ASIC) using a total cost-of-ownership model. The cost-of-ownership model has been used to arrive at the maximum tolerable defect level under a certain set of conditions. The cost-of-ownership model also reveals that device problems not detected by stuck-fault tests will eventually dominate cost of ownership as stuck faults are removed. It is noted that for certain typical conditions the economic level of fault coverage is essentially 100%
Keywords
VLSI; application specific integrated circuits; economics; fault location; integrated circuit testing; ASIC; IC testing; VLSI; application-specific integrated circuit; cost; economics; logic testing; stuck-fault coverage; Application specific integrated circuits; Automatic testing; Circuit faults; Circuit testing; Costs; Fault detection; Integrated circuit modeling; Integrated circuit technology; Integrated circuit testing; Logic testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location
Washington, DC
Type
conf
DOI
10.1109/TEST.1989.82391
Filename
82391
Link To Document