• DocumentCode
    1639585
  • Title

    Fault diagnosis based on post-test fault dictionary generation

  • Author

    Kato, Junko ; Shimono, Takeshi ; Kawai, Masato

  • Author_Institution
    NEC Corp., Tokyo, Japan
  • fYear
    1989
  • Firstpage
    940
  • Abstract
    A practical approach to fault diagnosis based on posttest fault dictionary generation is presented. Computer resources which are needed to generate a fault dictionary can be reduced drastically by utilizing the error symptoms obtained from go/no-go test execution. The approach has been applied to several circuits, and the results are very promising
  • Keywords
    VLSI; automatic testing; electronic engineering computing; fault location; integrated circuit testing; IC testing; VLSI; automatic testing; error symptoms; fault diagnosis; go/no-go test; post-test fault dictionary generation; Circuit faults; Circuit testing; Computer errors; Dictionaries; Error probability; Fault detection; Fault diagnosis; Fault location; Pins; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/TEST.1989.82392
  • Filename
    82392
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1639585