Title :
A sample-and-hold circuit implemented with mixed MOS transistor channel length technique used in 16-bit 100-MS/s A/D converter
Author :
Li, Ting ; Wang, Yuxin ; Li, Ruzhang
Author_Institution :
Nat. Lab. of Analog Integrated Circuits, Chongqing, China
Abstract :
This paper discusses the design and implementation of a sample-and-hold circuit integrated into a high-speed and high-resolution A/D converter. In order to achieve the required speed and resolution, mixed MOS transistor channel length amplifier is used. The sample-and-hold circuit processes a differential 2.5-Vp-p output signal swing and achieves 16-bit linearity with sampling frequency up to 100 MHz. Under these conditions, the total power consumption is 300 mW given by a single 3.3-V supply. The A/D converter is fabricated in a standard 0.35- μ m CMOS process technology, achieves 95.33-dBc spurious free dynamic range, 75.75-dBc signal-to-noise ratio for a 10.1-MHz input at -0.9dBFS at full sampling rate.
Keywords :
CMOS analogue integrated circuits; MOSFET; amplifiers; analogue-digital conversion; integrated circuit design; sample and hold circuits; CMOS process technology; differential output signal swing; high-resolution A/D converter; high-speed A/D converter; mixed MOS transistor channel length amplifier; mixed MOS transistor channel length technique; power 300 mW; power consumption; sample-and-hold circuit; sampling frequency; signal-to-noise ratio; size 0.35 mum; spurious free dynamic range; voltage 3.3 V; word length 16 bit; Capacitors; Converters; Linearity; MOSFETs; Power demand; Mixed channel length technique; Sample-and-hold;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
DOI :
10.1109/ICSICT.2010.5667740