Title :
Testing and testability of programmable logic devices
Author :
VanDerwiele, James M.
Author_Institution :
AT&T Network Syst., Oklahoma City, OK, USA
Abstract :
The author emphasizes that it is critical that thorough testing of programmable logic devices be included in the manufacturing process. Part of this testing is often done in the in-circuit test environment. It is concluded that testability must be programmed into these parts for successful in-circuit testing
Keywords :
logic arrays; logic testing; production testing; in-circuit test environment; logic testing; production testing; programmable logic devices; testability; Assembly; Circuit testing; Cities and towns; Logic testing; Manufacturing processes; Performance evaluation; Printed circuits; Production facilities; Programmable logic devices; System testing;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82396
