Title :
FUNTEST: a functional automatic test pattern generator for combinational circuits
Author :
Al-Arian, Saml A. ; Nordenso, Martin
Author_Institution :
Dept. of Comput. Sci. & Eng., South Florida Univ., Tampa, FL, USA
Abstract :
An automatic test pattern generator (ATPG) for combinational circuits based on a functional description has been developed. The algorithm generates tests on the basis of a set of Boolean equations or higher functional representations where little or no knowledge of the physical structure is required. A functional fault coverage is defined and related to structural fault coverage
Keywords :
Boolean functions; VLSI; automatic test equipment; automatic testing; combinatorial circuits; electronic engineering computing; integrated circuit testing; integrated logic circuits; logic testing; Boolean equations; FUNTEST; IC testing; VLSI; combinational circuits; functional automatic test pattern generator; functional fault coverage; structural fault coverage; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Equations; Logic testing; System testing; Test pattern generators;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82397
