• DocumentCode
    1639828
  • Title

    A 200MS/s 10-bit current-steering D/A converter with on-chip testbench

  • Author

    Wang, Shaopeng ; Ren, Yannan ; Yang, Changyi ; Li, Fule ; Wang, ZhiHua

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing, China
  • fYear
    2010
  • Firstpage
    296
  • Lastpage
    298
  • Abstract
    This paper presents a 10-bit 200MS/s CMOS current-steering digital-to-analog converter (DAC) with on-chip testbench. The proposed DAC adapts segmented architecture, composed of 6 MSBs unary and 4 LSBs binary-weighted cells. The measurement results show that the converter achieves a spurious-free dynamic range (SFDR) up to 78.7dBc. The full-scale output current is 20mA with 3V power supply for analog part, while the digital part of the chip operates at 1.8V. The DNL and INL are less than 0.07LSB and 0.15LSB respectively due to an improved current switching scheme. The active area of DAC core is 0.2mm2 in a standard 1P-6M 0.18μm CMOS process.
  • Keywords
    CMOS integrated circuits; digital-analogue conversion; integrated circuit testing; CMOS current-steering digital-to-analog converter; CMOS process; binary-weighted cell; current 20 mA; current switching; current-steering D/A converter; full-scale output current; on-chip testbench; segmented architecture; size 0.18 mum; spurious-free dynamic range; voltage 1.8 V; voltage 3 V; word length 10 bit; Arrays; Decoding; Impedance; Power supplies; Registers; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-5797-7
  • Type

    conf

  • DOI
    10.1109/ICSICT.2010.5667748
  • Filename
    5667748