Title :
Combinational and sequential circuit fault diagnosis using AI techniques
Author :
Rogel-Favila, Benjamin ; Cheung, Peter Ying Kay
Author_Institution :
Dept. of Electr. Eng., Imperial Coll. of Sci., Technol. & Med., London, UK
Abstract :
The authors describe an algorithm for the location of faults in digital circuits. It is based on the `deep reasoning´ approach to circuit fault diagnosis, and since a failure is defined as a mismatch between expected and measured behavior, it can deal with a wider range of different types of faults than traditional approaches. The application of the diagnosis procedure to examples of combinational and sequential circuits gives encouraging results
Keywords :
artificial intelligence; combinatorial circuits; fault location; logic testing; sequential circuits; algorithm; combinatorial circuits; deep reasoning; digital circuits; fault diagnosis; logic testing; mismatch; sequential circuit; Artificial intelligence; Circuit faults; Combinational circuits; Digital circuits; Educational institutions; Fault diagnosis; Feedback circuits; Feedback loop; Medical diagnostic imaging; Sequential circuits;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82401
