DocumentCode
1640026
Title
Impact of body bias on alpha- and neutron-induced soft error rates of flip-flops
Author
Karnik, Tanay ; Tschanz, James ; Bloeche, Bradley ; Hazucha, P. ; Armstrong, Pat ; Narendra, Siva ; Keshavarzi, Ali ; Soumyanath, K. ; Dermer, Greg ; Maiz, Jose ; Borkar, Shekhar ; De, Vivek
Author_Institution
Circuits Res., Intel Labs., Hillsboro, OR, USA
fYear
2004
Firstpage
324
Lastpage
325
Abstract
Soft error rate measurements for flip-flops on two testchips in 180nm and 130nm logic technologies show that using forward body bias improves alpha SER by 35% and neutron SER by 23%, while applying reverse body bias degrades SER by 9% to 36%. Body bias impact on SER remains virtually unchanged with technology scaling.
Keywords
CMOS logic circuits; alpha-particle effects; flip-flops; neutron effects; radiation hardening (electronics); 130 nm; 180 nm; alpha-induced soft error rates; flip-flops; forward body bias; neutron-induced soft error rates; Circuit testing; Clocks; Error analysis; Error correction; Error correction codes; Feedback loop; Flip-flops; Logic testing; Microprocessors; Neutrons;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on
Print_ISBN
0-7803-8287-0
Type
conf
DOI
10.1109/VLSIC.2004.1346603
Filename
1346603
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