Title :
Impact of body bias on alpha- and neutron-induced soft error rates of flip-flops
Author :
Karnik, Tanay ; Tschanz, James ; Bloeche, Bradley ; Hazucha, P. ; Armstrong, Pat ; Narendra, Siva ; Keshavarzi, Ali ; Soumyanath, K. ; Dermer, Greg ; Maiz, Jose ; Borkar, Shekhar ; De, Vivek
Author_Institution :
Circuits Res., Intel Labs., Hillsboro, OR, USA
Abstract :
Soft error rate measurements for flip-flops on two testchips in 180nm and 130nm logic technologies show that using forward body bias improves alpha SER by 35% and neutron SER by 23%, while applying reverse body bias degrades SER by 9% to 36%. Body bias impact on SER remains virtually unchanged with technology scaling.
Keywords :
CMOS logic circuits; alpha-particle effects; flip-flops; neutron effects; radiation hardening (electronics); 130 nm; 180 nm; alpha-induced soft error rates; flip-flops; forward body bias; neutron-induced soft error rates; Circuit testing; Clocks; Error analysis; Error correction; Error correction codes; Feedback loop; Flip-flops; Logic testing; Microprocessors; Neutrons;
Conference_Titel :
VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on
Print_ISBN :
0-7803-8287-0
DOI :
10.1109/VLSIC.2004.1346603
