DocumentCode :
1640171
Title :
A novel method of planar near-field scattering measurements
Author :
Ding, Yu ; Demin, Fu ; Qizhong, Liu ; Naihong, Mao
Author_Institution :
Nat. Lab. of Antennas & Microwave Technol., Xidian Univ., Xi´´an, China
Volume :
1
fYear :
2005
Firstpage :
483
Abstract :
A novel method of planar near-field scattering measurements, i.e. the method of self-transmitting and self-receiving (STSR) planar near-field scattering measurements is studied in theory and validated experimentally. The experiment results show that the relative value of scattering property obtained by means of this method has good engineering precision in an angle range near the outward normal direction of the scanning plane, which proves the correctness, validity and engineering practicability of this method.
Keywords :
electromagnetic wave scattering; receiving antennas; transmitting antennas; engineering precision; planar near-field scattering measurements; scanning plane detection; self-transmitting and self-receiver; Antenna measurements; Electromagnetic propagation; Electromagnetic scattering; Equations; Optical scattering; Performance evaluation; Position measurement; Probes; Sampling methods; Time measurement; Planar near-field scattering measurements; Relative value; Scattering property; Self-transmitting and self-receiving;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2005. MAPE 2005. IEEE International Symposium on
Print_ISBN :
0-7803-9128-4
Type :
conf
DOI :
10.1109/MAPE.2005.1617954
Filename :
1617954
Link To Document :
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