A novel method of planar near-field scattering measurements

Author

Ding, Yu ; Demin, Fu ; Qizhong, Liu ; Naihong, Mao

Author_Institution

Nat. Lab. of Antennas & Microwave Technol., Xidian Univ., Xi´´an, China

Volume

1

fYear

2005

Firstpage

483

Abstract

A novel method of planar near-field scattering measurements, i.e. the method of self-transmitting and self-receiving (STSR) planar near-field scattering measurements is studied in theory and validated experimentally. The experiment results show that the relative value of scattering property obtained by means of this method has good engineering precision in an angle range near the outward normal direction of the scanning plane, which proves the correctness, validity and engineering practicability of this method.

Keywords

electromagnetic wave scattering; receiving antennas; transmitting antennas; engineering precision; planar near-field scattering measurements; scanning plane detection; self-transmitting and self-receiver; Antenna measurements; Electromagnetic propagation; Electromagnetic scattering; Equations; Optical scattering; Performance evaluation; Position measurement; Probes; Sampling methods; Time measurement; Planar near-field scattering measurements; Relative value; Scattering property; Self-transmitting and self-receiving;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2005. MAPE 2005. IEEE International Symposium on

Print_ISBN

0-7803-9128-4

Type

conf

DOI

10.1109/MAPE.2005.1617954

Filename

1617954