Title : 
Ordered shapes of the CVD SiO2 evinced by wet etching
         
        
            Author : 
Baracu, Angela ; Pascu, R. ; Craciunoiu, F.
         
        
            Author_Institution : 
Nat. Inst. for R&D in Microtechnol. (IMT), Bucharest, Romania
         
        
        
        
        
        
            Abstract : 
As we know, both grown and deposited SiO2 is considered an amorphous material. A lot of experiments based on the silicon dioxide etching showed a series of micro and nano-formations which lead to a polycrystalline structure assumption. This paper is focused on the “crystalline” form of the SiO2 after a wet etching in NH4F:CH3COOH solution. In order to modify the selectivity of the mixture, we have tested 3 different concentrations. There were performed a lot of investigations using SEM, AFM and Optical microscopy.
         
        
            Keywords : 
atomic force microscopy; chemical vapour deposition; etching; optical microscopy; scanning electron microscopy; silicon compounds; AFM; CVD; SEM; SiO2; amorphous material; microformation; mixture; nanoformation; optical microscopy; polycrystalline structure; silicon dioxide etching; wet etching; Etching; Optical films; Plasma temperature; Shape; Silicon; Silicon compounds; Pad-etch solution; crystallographic planes; polycrystalline; ramp; silicon oxide; wet etching;
         
        
        
        
            Conference_Titel : 
Semiconductor Conference (CAS), 2014 International
         
        
            Conference_Location : 
Sinaia
         
        
        
            Print_ISBN : 
978-1-4799-3916-9
         
        
        
            DOI : 
10.1109/SMICND.2014.6966410