Title :
Ordered shapes of the CVD SiO2 evinced by wet etching
Author :
Baracu, Angela ; Pascu, R. ; Craciunoiu, F.
Author_Institution :
Nat. Inst. for R&D in Microtechnol. (IMT), Bucharest, Romania
Abstract :
As we know, both grown and deposited SiO2 is considered an amorphous material. A lot of experiments based on the silicon dioxide etching showed a series of micro and nano-formations which lead to a polycrystalline structure assumption. This paper is focused on the “crystalline” form of the SiO2 after a wet etching in NH4F:CH3COOH solution. In order to modify the selectivity of the mixture, we have tested 3 different concentrations. There were performed a lot of investigations using SEM, AFM and Optical microscopy.
Keywords :
atomic force microscopy; chemical vapour deposition; etching; optical microscopy; scanning electron microscopy; silicon compounds; AFM; CVD; SEM; SiO2; amorphous material; microformation; mixture; nanoformation; optical microscopy; polycrystalline structure; silicon dioxide etching; wet etching; Etching; Optical films; Plasma temperature; Shape; Silicon; Silicon compounds; Pad-etch solution; crystallographic planes; polycrystalline; ramp; silicon oxide; wet etching;
Conference_Titel :
Semiconductor Conference (CAS), 2014 International
Conference_Location :
Sinaia
Print_ISBN :
978-1-4799-3916-9
DOI :
10.1109/SMICND.2014.6966410