DocumentCode :
164068
Title :
Ordered shapes of the CVD SiO2 evinced by wet etching
Author :
Baracu, Angela ; Pascu, R. ; Craciunoiu, F.
Author_Institution :
Nat. Inst. for R&D in Microtechnol. (IMT), Bucharest, Romania
fYear :
2014
fDate :
13-15 Oct. 2014
Firstpage :
121
Lastpage :
124
Abstract :
As we know, both grown and deposited SiO2 is considered an amorphous material. A lot of experiments based on the silicon dioxide etching showed a series of micro and nano-formations which lead to a polycrystalline structure assumption. This paper is focused on the “crystalline” form of the SiO2 after a wet etching in NH4F:CH3COOH solution. In order to modify the selectivity of the mixture, we have tested 3 different concentrations. There were performed a lot of investigations using SEM, AFM and Optical microscopy.
Keywords :
atomic force microscopy; chemical vapour deposition; etching; optical microscopy; scanning electron microscopy; silicon compounds; AFM; CVD; SEM; SiO2; amorphous material; microformation; mixture; nanoformation; optical microscopy; polycrystalline structure; silicon dioxide etching; wet etching; Etching; Optical films; Plasma temperature; Shape; Silicon; Silicon compounds; Pad-etch solution; crystallographic planes; polycrystalline; ramp; silicon oxide; wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference (CAS), 2014 International
Conference_Location :
Sinaia
ISSN :
1545-827X
Print_ISBN :
978-1-4799-3916-9
Type :
conf
DOI :
10.1109/SMICND.2014.6966410
Filename :
6966410
Link To Document :
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