• DocumentCode
    164068
  • Title

    Ordered shapes of the CVD SiO2 evinced by wet etching

  • Author

    Baracu, Angela ; Pascu, R. ; Craciunoiu, F.

  • Author_Institution
    Nat. Inst. for R&D in Microtechnol. (IMT), Bucharest, Romania
  • fYear
    2014
  • fDate
    13-15 Oct. 2014
  • Firstpage
    121
  • Lastpage
    124
  • Abstract
    As we know, both grown and deposited SiO2 is considered an amorphous material. A lot of experiments based on the silicon dioxide etching showed a series of micro and nano-formations which lead to a polycrystalline structure assumption. This paper is focused on the “crystalline” form of the SiO2 after a wet etching in NH4F:CH3COOH solution. In order to modify the selectivity of the mixture, we have tested 3 different concentrations. There were performed a lot of investigations using SEM, AFM and Optical microscopy.
  • Keywords
    atomic force microscopy; chemical vapour deposition; etching; optical microscopy; scanning electron microscopy; silicon compounds; AFM; CVD; SEM; SiO2; amorphous material; microformation; mixture; nanoformation; optical microscopy; polycrystalline structure; silicon dioxide etching; wet etching; Etching; Optical films; Plasma temperature; Shape; Silicon; Silicon compounds; Pad-etch solution; crystallographic planes; polycrystalline; ramp; silicon oxide; wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference (CAS), 2014 International
  • Conference_Location
    Sinaia
  • ISSN
    1545-827X
  • Print_ISBN
    978-1-4799-3916-9
  • Type

    conf

  • DOI
    10.1109/SMICND.2014.6966410
  • Filename
    6966410