Title :
Probabilistic inference in a knowledge-based quality information system for consumer electronics production
Author_Institution :
Lehrstuhl fur Elektrische Regelungstech., RWTH, Aachen, Germany
Abstract :
A quality information system (QIS) installed in a West German plant for consumer electronics production that features a number of conventional data processing capabilities and an expert system for both data interpretation and fault diagnosis is discussed. The diagnostic portion of the QIS expert system is discussed, and a detailed description of the inference algorithm, which mainly uses the approaches of semantic nets and probabilistic inference is given. The experience gained during knowledge acquisition, system realization, and system application in the industrial environment is discussed
Keywords :
expert systems; fault location; inference mechanisms; manufacturing data processing; probability; quality control; QIS; consumer electronics production; data interpretation; expert system; fault diagnosis; industrial environment; inference algorithm; knowledge-based quality information system; probabilistic inference; semantic nets; system application; system realization; Computer industry; Consumer electronics; Data processing; Diagnostic expert systems; Engines; Inference algorithms; Information systems; Manufacturing processes; Production systems; Virtual manufacturing;
Conference_Titel :
Industrial Electronics Society, 1990. IECON '90., 16th Annual Conference of IEEE
Conference_Location :
Pacific Grove, CA
Print_ISBN :
0-87942-600-4
DOI :
10.1109/IECON.1990.149232
