Study on effect experiment of ESD EMP to single chip microcontroller

Author

Zhang, Xijun ; Wu, Zhancheng ; Song, Xuejun ; Song, Wenwu

Author_Institution

Res. Inst. of Electrostatic & Electromagn. Protection, Shijiazhuang Mech. Eng. Coll.

Volume

1

fYear

2005

Firstpage

631

Abstract

Choosing 8031 minimal systems, a familiar MCS-51 series SCM (single chip microcontroller), as experimental object, this-paper studies irradiation field effects & effecting mechanism of ESD EMP (electrostatic discharge electromagnetic pulse) via effecting experiment and theory research respectively. The interference & damage threshold of SCM in different, failure modes are ascertained. By analyzing the failure reasons, some rules of ESD EMP effects are concluded. This paper serves to provide practical SCM designs with a thorough and heady reference in dealing with complex-ESD protection design for automatic control equipment

Keywords

electromagnetic pulse; electrostatic discharge; microcontrollers; ESD EMP; automatic control equipment; electrostatic discharge electromagnetic pulse; irradiation field effects; single chip microcontroller; Automatic control; Capacitance; Circuits; EMP radiation effects; Educational institutions; Electrostatic discharge; Electrostatic interference; Immunity testing; Microcontrollers; Protection;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications, 2005. MAPE 2005. IEEE International Symposium on

Conference_Location

Beijing

Print_ISBN

0-7803-9128-4

Type

conf

DOI

10.1109/MAPE.2005.1617990

Filename

1617990