Title :
2005 Symposium on VLSI Technology (IEEE Cat. No. 05CH37642)
Abstract :
Presents the front cover, front matter, and table of contents from the conference proceedings.
Keywords :
CMOS integrated circuits; DRAM chips; MOSFET; VLSI; dielectric thin films; flash memories; integrated circuit reliability; integrated circuit technology; DRAM; Ge channel transistor; VLSI; [110] channel transistor; advanced CMOS technology; advanced memories; analog-RF devices; flash memory; gate dielectric reliability; high k dielectric technology; metal gate technology; multigate Fin FET technology; process technology; strain enhanced CMOS;
Conference_Titel :
VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-8287-0
DOI :
10.1109/VLSIC.2004.1346654
