Title :
Constraint random stimuli and functional coverage on mixed signal verification
Author :
Iliuta, Ioana ; Tepus, Cristian
Author_Institution :
Infineon Technol. Romania, Bucharest, Romania
Abstract :
With a constantly increasing complexity, developing today´s IC is more challenging not only in design, but also in integration and verification. The new approach is to use the same tools and methodologies from digital verification and to extended them to mixed signal, resulting a metric driven functional and electrical verification. In this paper the reasons for using this technique will be described, together with methodology and environment, providing also, as a demonstration and an argument, a practical example.
Keywords :
circuit complexity; mixed analogue-digital integrated circuits; system-on-chip; circuit complexity; constraint random stimuli; digital verification; electrical verification; functional coverage; metric driven functional verification; mixed signal verification; Complexity theory; Measurement; Monitoring; Registers; System-on-chip; Threshold voltage; Writing; constraint random generation; functional coverage; mixed signal verification;
Conference_Titel :
Semiconductor Conference (CAS), 2014 International
Conference_Location :
Sinaia
Print_ISBN :
978-1-4799-3916-9
DOI :
10.1109/SMICND.2014.6966446