Title :
Thermal characterization of electronic parts with compact models: interpretation, application, and the need for a paradigm shift
Author :
Lasance, Clemens J M
Author_Institution :
Philips Res. Labs., Eindhoven, Netherlands
Abstract :
In recent years, renewed interest in the thermal characterization of electronic parts has been driven by the need for more accurate thermal analyses at board and system levels. A European consortium, partially funded by the European Community under the ESPRIT contract code-named DELPHI, has published a series of papers dealing with both numerical and experimental aspects of accurate numerical modelling and experimental validation. Their approach has spawned many discussions, amongst engineers and scientists alike, about the physical integrity of the compact models, about the accuracy required by end-users given the other unknowns at system level, and about the practical generation and implementation of the models. Another interesting area of endless discussion concerns the questionable notion of the thermal resistance as the analog of the electrical resistance. It is argued that the analogy between electrical and thermal resistances is only valid for unrealistic boundary conditions, so the terminology commonly used in the thermal characterization of electronic parts should be reconsidered. This paper hopes to set the stage for fundamental considerations about current and future ways of generating and presenting thermal data for electronic parts, which may possibly be of value for both component manufacturers and system designers
Keywords :
integrated circuit modelling; integrated circuit packaging; plastic packaging; thermal analysis; thermal resistance; DELPHI; ESPRIT contract; IC packaging; board level; compact models; electronic parts; paradigm shift; physical integrity; plastic packages; system level; thermal characterization; thermal resistance; Boundary conditions; Contracts; Cooling; Electric resistance; Joining processes; Laboratories; Packaging; Resistors; Temperature; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1997. SEMI-THERM XIII., Thirteenth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3793-X
DOI :
10.1109/STHERM.1997.566781