Title :
Truncation-error reduction in 2D spherical/cylindrical near-field scanning
Author :
Kim, Kristopher T.
Author_Institution :
Sensors Directorate, Air Force Res. Lab., Hanscom AFB, MA, USA
Abstract :
The spherical and cylindrical near-field (NF) antenna measurement techniques are an indispensable tool for the antenna community. NF samples are almost always collected over a truncated surface. Far-field (FF) values computed from truncated NF data suffer from truncation errors. In this paper, we introduce a new NF-toFF transformation for two-dimensional cylindrical/spherical scanning that significantly reduces truncation errors. After examining the limitations of the traditional multipole-based expansion of truncated scan data, we consider an alternative expansion based on Slepian functions and show how FF values can be extracted from the resulting expansion coefficients.
Keywords :
antenna testing; error analysis; 2D spherical-cylindrical near-field scanning; NF-to-FF transformation; Slepian functions; cylindrical near-field antenna measurement techniques; truncation error reduction; Antennas; Eigenvalues and eigenfunctions; Finite wordlength effects; Matrices; Noise; Noise measurement; Symmetric matrices;
Conference_Titel :
Antenna Technology and Applied Electromagnetics & the American Electromagnetics Conference (ANTEM-AMEREM), 2010 14th International Symposium on
Conference_Location :
Ottawa, ON
Print_ISBN :
978-1-4244-5049-7
Electronic_ISBN :
978-1-4244-5050-3
DOI :
10.1109/ANTEM.2010.5552551