DocumentCode :
1641620
Title :
Local appearance-based models using high-order statistics of image features
Author :
Moghaddam, Baback ; Guillamet, David ; Vitrià, Jordi
Author_Institution :
Res. Labs., Mitsubishi Electr., Cambridge, MA, USA
Volume :
1
fYear :
2003
Abstract :
We propose a novel local appearance modeling method for object detection and recognition in cluttered scenes. The approach is based on the joint distribution of local feature vectors at multiple salient points and factorization with the independent component analysis (ICA). The resulting densities are simple multiplicative distributions modeled through adaptive Gaussian mixture models. This leads to computationally tractable joint probability densities, which can model high-order dependencies. Furthermore, different models are compared based on appearance, color and geometry information. Also, the combination of all of them results in a hybrid model, which obtains the best results using the COIL-100 object database. Our technique has been tested under different natural and cluttered scenes with different degrees of occlusions with promising results. Finally, a large statistical test with the MNIST digit database is used to demonstrate the improved performance obtained by explicit modeling of high-order dependencies.
Keywords :
computational geometry; feature extraction; higher order statistics; image colour analysis; independent component analysis; object recognition; probability; COIL-100 object database; adaptive Gaussian mixture model; cluttered scene; color information; geometry information; high-order dependency modeling; high-order statistics; image feature; independent component analysis; joint distribution; joint probability density; local appearance-based model; local feature vector; multiple salient points; multiplicative distribution; object detection; object recognition; object representation; Computer vision; Data mining; Independent component analysis; Information geometry; Layout; Object detection; Solid modeling; Spatial databases; Statistics; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 2003. Proceedings. 2003 IEEE Computer Society Conference on
ISSN :
1063-6919
Print_ISBN :
0-7695-1900-8
Type :
conf
DOI :
10.1109/CVPR.2003.1211425
Filename :
1211425
Link To Document :
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