DocumentCode
1641672
Title
Evaluating 4H-SiC based commercial MOSFETs power modules
Author
Nawaz, Muhammad ; Nan Chen
Author_Institution
ABB Corp. Res., Vasteras, Sweden
fYear
2015
Firstpage
462
Lastpage
466
Abstract
This work deals with static and dynamic measurements performed for 4H-SiC based commercial MOSFETs power modules with voltage rating of 1200 V and current rating of 120 A. First results from engineering samples from Rohm show overall good confidence level that resulted in an ON-resistance of 20-30 mΩ, blocking voltage of 1300-1500 V and threshold voltage of 3.0-3.5 V. Power modules have been tested upto 150 °C (recommended Tj was 125°C) where a threshold voltage shift (i.e., decreases) and decay in the peak transconductance is observed. Overall, energy losses remain approximately unchanged with variation in the device temperature. Turn on and turn off energy losses at 800 V and 190 A (120 A) of 102 (38) and 22 (12) mJ respectively, have been obtained at 300 K. Contrary to Si, SiC power modules did not show reverse recovery neither at different supply voltages nor at different temperatures. A short circuit withstand capability of over 10 μS is witnessed when tested under hard switch fault condition. A small current sharing unbalance has been observed for two parallel power modules as a result of either DC capacitor derating or quasi-symmetrical busbar design when the total current far exceeds the current rating of the power module (i.e., 120 A).
Keywords
elemental semiconductors; power MOSFET; power capacitors; short-circuit currents; silicon; silicon compounds; wide band gap semiconductors; 4H-SiC based commercial MOSFET power module evaluation; DC capacitor derating; Si power module; current 120 A; current 190 A; dynamic measurement; energy losses; hard switch fault condition; peak transconductance; quasisymmetrical busbar design; resistance 20 ohm to 30 ohm; short circuit withstand capability; small current sharing unbalance; static measurement; temperature 300 K; threshold voltage shift; voltage 1200 V to 1500 V; voltage 3 V to 3.5 V; voltage 800 V; Energy loss; Inductance; Logic gates; MOSFET; Multichip modules; Silicon carbide; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and Drive Systems (PEDS), 2015 IEEE 11th International Conference on
Conference_Location
Sydney, NSW
Type
conf
DOI
10.1109/PEDS.2015.7203439
Filename
7203439
Link To Document