DocumentCode
1641791
Title
A 1 V built-in intermediate voltage sensor
Author
Tang, Jing-Jou
Author_Institution
Dept. of Electron. Eng., Southern Taiwan Univ. of Technol., Tainan, Taiwan
fYear
1999
fDate
6/21/1905 12:00:00 AM
Firstpage
299
Lastpage
302
Abstract
In this paper, a novel circuit design that can detect faults resulting in intermediate voltage values is presented. This design can also be used to detect slow transition faults and the metastability of a circuit under test. The power supply of this circuit is only 1 V. Thus it can be used for not only conventional circuits but also the low voltage (LV) circuits
Keywords
CMOS digital integrated circuits; built-in self test; design for testability; electric sensing devices; fault location; integrated circuit testing; logic testing; voltage measurement; 1 V; DFT; LV circuits; built-in intermediate voltage sensor; builtin sensor; circuit design; fault detection; low voltage circuits; metastability; slow transition faults; Circuit faults; Circuit synthesis; Circuit testing; Electrical fault detection; Fault detection; Logic circuits; Logic testing; Low voltage; Metastasis; Multivalued logic;
fLanguage
English
Publisher
ieee
Conference_Titel
ASICs, 1999. AP-ASIC '99. The First IEEE Asia Pacific Conference on
Conference_Location
Seoul
Print_ISBN
0-7803-5705-1
Type
conf
DOI
10.1109/APASIC.1999.824088
Filename
824088
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