DocumentCode :
1641892
Title :
A GaN HEMT equivalent circuit model with novel approach to dispersion modelling
Author :
King, Justin B. ; Brazil, Thomas J.
Author_Institution :
Sch. of Electr., Electron. & Commun. Eng., Univ. Coll. Dublin, Dublin, Ireland
fYear :
2012
Firstpage :
68
Lastpage :
71
Abstract :
A complete equivalent circuit model (ECM) for a gallium nitride (GaN) high electron-mobility transistor (HEMT) is described. The model can accurately calculate the pulsed IV (PIV) drain-current over a large range of time instants, while simultaneously providing excellent predication of the DC drain characteristics. This highly accurate fit is achieved using a novel dispersion modelling procedure, which is described within. Trapping effects are taken into account by an effective voltage calculated via filter networks at the gate and drain which allow automatic model calculation of the device quiescent point. One-tone and two-tone tests show very good harmonic and intermodulation distortion prediction capabilities of the model, from small signal up to saturation power levels. Small-signal results are also demonstrated in the form of measured and modelled S-parameters.
Keywords :
III-V semiconductors; S-parameters; dispersion (wave); equivalent circuits; filters; gallium compounds; harmonic distortion; high electron mobility transistors; intermodulation distortion; semiconductor device models; semiconductor device testing; wide band gap semiconductors; DC drain characteristics; ECM; GaN; HEMT equivalent circuit model; PIV; S-parameter modeling; automatic model calculation; device quiescent point; dispersion modelling procedure; filter network; harmonic distortion; high electron-mobility transistor; intermodulation distortion prediction; one-tone testing; power level saturation; pulsed IV drain-current; trapping effect; two-tone testing; voltage calculation; Dispersion; Gallium nitride; HEMTs; Integrated circuit modeling; Mathematical model; Microwave transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2012 7th European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2302-4
Electronic_ISBN :
978-2-87487-026-2
Type :
conf
Filename :
6483737
Link To Document :
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