DocumentCode
1641892
Title
A GaN HEMT equivalent circuit model with novel approach to dispersion modelling
Author
King, Justin B. ; Brazil, Thomas J.
Author_Institution
Sch. of Electr., Electron. & Commun. Eng., Univ. Coll. Dublin, Dublin, Ireland
fYear
2012
Firstpage
68
Lastpage
71
Abstract
A complete equivalent circuit model (ECM) for a gallium nitride (GaN) high electron-mobility transistor (HEMT) is described. The model can accurately calculate the pulsed IV (PIV) drain-current over a large range of time instants, while simultaneously providing excellent predication of the DC drain characteristics. This highly accurate fit is achieved using a novel dispersion modelling procedure, which is described within. Trapping effects are taken into account by an effective voltage calculated via filter networks at the gate and drain which allow automatic model calculation of the device quiescent point. One-tone and two-tone tests show very good harmonic and intermodulation distortion prediction capabilities of the model, from small signal up to saturation power levels. Small-signal results are also demonstrated in the form of measured and modelled S-parameters.
Keywords
III-V semiconductors; S-parameters; dispersion (wave); equivalent circuits; filters; gallium compounds; harmonic distortion; high electron mobility transistors; intermodulation distortion; semiconductor device models; semiconductor device testing; wide band gap semiconductors; DC drain characteristics; ECM; GaN; HEMT equivalent circuit model; PIV; S-parameter modeling; automatic model calculation; device quiescent point; dispersion modelling procedure; filter network; harmonic distortion; high electron-mobility transistor; intermodulation distortion prediction; one-tone testing; power level saturation; pulsed IV drain-current; trapping effect; two-tone testing; voltage calculation; Dispersion; Gallium nitride; HEMTs; Integrated circuit modeling; Mathematical model; Microwave transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Integrated Circuits Conference (EuMIC), 2012 7th European
Conference_Location
Amsterdam
Print_ISBN
978-1-4673-2302-4
Electronic_ISBN
978-2-87487-026-2
Type
conf
Filename
6483737
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