• DocumentCode
    1641892
  • Title

    A GaN HEMT equivalent circuit model with novel approach to dispersion modelling

  • Author

    King, Justin B. ; Brazil, Thomas J.

  • Author_Institution
    Sch. of Electr., Electron. & Commun. Eng., Univ. Coll. Dublin, Dublin, Ireland
  • fYear
    2012
  • Firstpage
    68
  • Lastpage
    71
  • Abstract
    A complete equivalent circuit model (ECM) for a gallium nitride (GaN) high electron-mobility transistor (HEMT) is described. The model can accurately calculate the pulsed IV (PIV) drain-current over a large range of time instants, while simultaneously providing excellent predication of the DC drain characteristics. This highly accurate fit is achieved using a novel dispersion modelling procedure, which is described within. Trapping effects are taken into account by an effective voltage calculated via filter networks at the gate and drain which allow automatic model calculation of the device quiescent point. One-tone and two-tone tests show very good harmonic and intermodulation distortion prediction capabilities of the model, from small signal up to saturation power levels. Small-signal results are also demonstrated in the form of measured and modelled S-parameters.
  • Keywords
    III-V semiconductors; S-parameters; dispersion (wave); equivalent circuits; filters; gallium compounds; harmonic distortion; high electron mobility transistors; intermodulation distortion; semiconductor device models; semiconductor device testing; wide band gap semiconductors; DC drain characteristics; ECM; GaN; HEMT equivalent circuit model; PIV; S-parameter modeling; automatic model calculation; device quiescent point; dispersion modelling procedure; filter network; harmonic distortion; high electron-mobility transistor; intermodulation distortion prediction; one-tone testing; power level saturation; pulsed IV drain-current; trapping effect; two-tone testing; voltage calculation; Dispersion; Gallium nitride; HEMTs; Integrated circuit modeling; Mathematical model; Microwave transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Integrated Circuits Conference (EuMIC), 2012 7th European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-1-4673-2302-4
  • Electronic_ISBN
    978-2-87487-026-2
  • Type

    conf

  • Filename
    6483737