DocumentCode :
164190
Title :
Synthetic testing of medium voltage load break switches
Author :
Islam, Aminul ; Birtwhistle, D. ; Saha, Tapan K.
Author_Institution :
Sch. of Inf. Technol. & Electr. Eng., Univ. of Queensland, Brisbane, QLD, Australia
fYear :
2014
fDate :
Sept. 28 2014-Oct. 1 2014
Firstpage :
1
Lastpage :
5
Abstract :
This paper represents a multi-part switching test technique for testing Load Break Switches (LBS) using the basic synthetic test circuit (Weil circuit). In order to define the transient recovery voltage (TRV) due to LBS contact opening, a 4-parameter TRV envelope is proposed with an initial time delay parameter. A comparison between IEEE and IEC standard requirements has been made to compare the relative severity of TRV specified by the two standards. Simulation results revealed that it is possible to ensure both dielectric and thermal re-ignition withstand capability by using a two-part synthetic testing technique. Limitations with the method that result in excessive TRV are discussed.
Keywords :
IEC standards; IEEE standards; delays; distribution networks; ignition; switches; switching circuits; 4-parameter TRV envelope; IEC standard requirements; IEEE standard requirements; LBS; Weil circuit; basic synthetic test circuit; dielectric re-ignition; medium voltage load break switches; multipart switching test; thermal re-ignition; time delay parameter; transient recovery voltage; two-part synthetic testing; Delay effects; Educational institutions; IEC standards; Reactive power; Switches; Testing; Transient analysis; Synthetic testing; TRV envelope; load break switch; transient recovery voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Conference (AUPEC), 2014 Australasian Universities
Conference_Location :
Perth, WA
Type :
conf
DOI :
10.1109/AUPEC.2014.6966473
Filename :
6966473
Link To Document :
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