DocumentCode :
1641915
Title :
A vacuum/airtight package with multifunctional LTCC substrate and integrated pirani vacuum gauge for 3D SIP integration applications
Author :
Miao, Min ; Gan, Hua ; Jin, Yufeng ; Li, Zhensong
Author_Institution :
Inf. Microsyst. Inst., Beijing Inf. Sci. & Technol. Univ., Beijing, China
fYear :
2010
Firstpage :
1961
Lastpage :
1963
Abstract :
This paper reports the design and initial experimental investigation of a vacuum/airtight package, based on a multilayered LTCC substrate that acts not only as a chip carrier with flexible interconnects but an integrated panel with multiple functional structure. Design, validation and experimental results for various cooling microchannels embedded into the substrate are presented; the substrate temperature rise is cut by over 70% compared with substrate without microchannels. The effect of vacuum on cooling is simulated. A hot-wire micro Pirani gauge are integrated onto the substrate by wire bonding for a simple and effective in-situ vacuum measuring. The packaged sample display a leakage rate of lower than 10-12 Pa · m3/s. Therefore, this packaging can be an optimal choice for 3D system-in-package applications demanding high integration density, medium vacuum circumstance and long usage/storage lifecycle.
Keywords :
lead bonding; system-in-package; 3D SIP integration applications; cooling microchannels; high integration density; integrated Pirani vacuum gauge; integrated panel; low temperature cofired ceramic; medium vacuum circumstance; multilayered LTCC substrate; multiple functional structure; system-in-package integration; usage-storage lifecycle; vacuum measuring; vacuum-airtight package; wire bonding; Cooling; Fractals; Metals; Microchannel; Substrates; Temperature measurement; Wire; In-situ Vacuum Measurement; Low Temperature Co-fired Ceramic (LTCC); Microchannel; Pirani Gauge; System-in-Package (SiP); Vacuum Packaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
Type :
conf
DOI :
10.1109/ICSICT.2010.5667825
Filename :
5667825
Link To Document :
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