Title :
Investigation of LO-leakage cancellation and DC-offset influence on flicker-noise in X-band mixers
Author :
Michaelsen, Rasmus ; Johansen, Tom ; Tamborg, Kjeld
Author_Institution :
Dept. of Electr. Eng., Tech. Univ. of Denmark, Lyngby, Denmark
Abstract :
This paper describes an investigation on the influences in 1/f noise of LO-leakage and DC-offset cancellation for X-band mixers. Conditions for LO-leakage cancellation and zero DC-offset is derived. Measurements on a double balanced diode mixer shows an improvement in noise figure from 14.3 dB to 12.1 dB at 10 KHz, while maintaining a noise figure of 6.2 dB at 1 MHz. LO-RF isolation is improved from 18 dB to 60 dB. The 1/f noise is shown to increase with increasing DC-offset.
Keywords :
1/f noise; microwave mixers; 1/f noise; DC-offset influence; LO-RF isolation; LO-leakage cancellation; X-band mixers; double-balanced diode mixer; flicker noise; frequency 1 MHz; frequency 10 kHz; noise figure; noise figure 14.3 dB to 12.1 dB; Integrated circuit modeling; Microwave FET integrated circuits; Microwave circuits; Mixers; Noise; Noise measurement; Radio frequency; 1/f noise; Mixers; Receivers;
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2012 7th European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2302-4
Electronic_ISBN :
978-2-87487-026-2
