Title :
State-space-based uncertainty analysis for identification of faulty behaviour
Author_Institution :
LJMU, Liverpool, UK
Abstract :
The operation of a circuit or a system can be viewed as a process. The execution of a process may be governed by a set of parameters, internal and/or external to the process. Variations in parameters - outside predetermined upper limits - may yield abnormal functional behaviour. This paper presents state-space-based analytical modelling expressions for the identification of faulty behaviour in circuits and systems, independent of simulation.
Keywords :
circuit simulation; fault simulation; integrated circuit modelling; state-space methods; abnormal functional behaviour; faulty behaviour identification; state-space-based analytical modelling expressions; state-space-based uncertainty analysis; Biosensors; Circuit faults; Fluctuations; Optical filters; Testing; Transfer functions;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
DOI :
10.1109/ICSICT.2010.5667843
