Automated determination of device noise parameters using multi-frequency, source-pull data

In this paper a novel approach for determining device noise parameters over frequency is presented. Such methodology is made of two parts: the first one allows to straightforwardly extract single-frequency noise parameters from source-pull data; the second one extends this capability to multi-frequency, source-pull data to obtain a full description of device noise behavior over frequency by means of at most ten constant parameters (depending on the required accuracy). The whole process is automated via a software routine and does not need a previous knowledge of the active device equivalent circuit.