Title :
0.1µm GaAs pHEMT technology and associated modelling for millimeter wave low noise amplifiers
Author :
Teyssandier, C. ; Stieglauer, H. ; Byk, E. ; Couturier, A. ; Fellon, P. ; Camiade, M. ; Blanck, H. ; Floriot, D.
Author_Institution :
United Monolithic Semicond. SAS, Villebon-sur-Yvette, France
Abstract :
Applications in the range of E to W bands are emerging during the last years specially in the field of Radio and security for active scanning systems. It required both low noise receiver and medium power amplifier which needs to use high performances, reliable millimeter wave technology. This paper describes basic fundamental of a 0.1 μm gate length process in term of process, characteristics and modelling. A specific emphasis is attached to the modelling issue in this domain of frequency and the difficulty to get reliable analysis. It is stressed at the end that thanks to accurate modelling in the low frequency part (Ka to Q bands), it allows to predict the behaviour of the device in E band. This methodology has been successfully applied to the design of a wideband LNA and HPA.
Keywords :
III-V semiconductors; gallium arsenide; low noise amplifiers; millimetre wave power amplifiers; power HEMT; E band; GaAs; HPA; W band; active scanning system; gate length process; low noise receiver; medium power amplifier; millimeter wave low noise amplifier; pHEMT technology; radio; reliable millimeter wave technology; security; size 0.1 mum; wideband LNA; Gain; Gallium arsenide; Logic gates; Mathematical model; Noise; PHEMTs; MMIC low noise amplifier; low frequency modelling; millimeter wave FET; pHEMT;
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2012 7th European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2302-4
Electronic_ISBN :
978-2-87487-026-2