DocumentCode :
1642781
Title :
Packaging effects on the performances of MEMS for high-G accelerometer: frequency-domain and time-domain analyses
Author :
Cheng, Zhaonian ; Huang, Weidong ; Cai, Xia ; Xu, Bulu ; Luo, Le ; Li, Xinxin
Author_Institution :
Shanghai Inst. of Microsyst. & Inf. Technol., Chinese Acad. of Sci., Shanghai, China
fYear :
2004
Firstpage :
282
Lastpage :
289
Abstract :
In this work, the finite element simulations have been applied in frequency-domain and time-domain analyses for a packaged MEMS accelerometer used in high-G environments. The results from simulations of packaging effects on the performances of MEMS for high-G accelerometer show that the Young´s moduli of seal adhesive has important influences on the mode shapes of the packaged accelerometer and a small Young´s modulus will bring in strong distortion of output signal of accelerometer. As the Young´s moduli increased, the waveform of accelerometer output signal became better after digital filtering. The seal adhesive with Young´s modulus like molding compound in IC packaging would not induce significant problems in signal distortion. The frequency and averaged amplitude of output signal of the packaged accelerometer were not affected by Young´s modulus of seal material. The accelerometer output was linearly dependent on the input of acceleration impulse and the response was very well when the input of the acceleration amplitudes changed.
Keywords :
Young´s modulus; accelerometers; distortion; finite element analysis; frequency-domain analysis; micromechanical devices; semiconductor device packaging; time-domain analysis; IC packaging; MEMS accelerometer; MEMS performance; Young modulus; acceleration amplitudes; digital filtering; finite element simulations; frequency-domain analysis; high-G accelerometer; high-G environments; mode shapes; molding compound; output signal; packaged accelerometer; packaging effects; seal adhesive; sensor packaging; signal distortion; time-domain analysis; Acceleration; Accelerometers; Analytical models; Distortion; Finite element methods; Frequency domain analysis; Micromechanical devices; Packaging; Seals; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2004. HDP '04. Proceeding of the Sixth IEEE CPMT Conference on
Print_ISBN :
0-7803-8620-5
Type :
conf
DOI :
10.1109/HPD.2004.1346712
Filename :
1346712
Link To Document :
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