Title :
Stochastic Analysis and Measurement of Error Vector Magnitude of OFDM Signal in MMIC Nonlinear Power Amplifier
Author :
Kim, Joon Hyung ; Kwon, Heon Kuk ; Jung, Jae Ho ; Kim, Sung Min ; Lee, Gwang Cheon
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon
Abstract :
Theoretical approach to predict the error vector magnitude (EVM) performance of an orthogonal frequency-division multiplexing (OFDM) system in the presence of nonlinear distortion caused by RF amplifiers is described. It is shown that the EVM model can be described by means of the autocorrelation of uncorrelated distortion noise term and a common complex gain. For the experimental validation, an EVM value of modulated signals through the fabricated HBT MMIC power amplifier is derived by the proposed method and compared with the measurement results.
Keywords :
MMIC power amplifiers; OFDM modulation; heterojunction bipolar transistors; stochastic processes; HBT MMIC power amplifier; MMIC nonlinear power amplifier; OFDM signal; RF amplifiers; distortion noise term; error vector magnitude; heterojunction bipolar transistors; modulated signals; monolithic microwave integrated circuits; nonlinear distortion; orthogonal frequency division multiplexing system; stochastic analysis; Distortion measurement; Frequency division multiplexing; MMICs; Nonlinear distortion; OFDM; Power amplifiers; Power measurement; Radiofrequency amplifiers; Signal analysis; Stochastic processes;
Conference_Titel :
Vehicular Technology Conference, 2006. VTC-2006 Fall. 2006 IEEE 64th
Conference_Location :
Montreal, Que.
Print_ISBN :
1-4244-0062-7
Electronic_ISBN :
1-4244-0063-5
DOI :
10.1109/VTCF.2006.605
