Title : 
Electron emission from geometrically complex thermionic cathodes
         
        
        
            Author_Institution : 
EG&G Optoelectron., Salem, MA, USA
         
        
        
        
            Abstract : 
Summary form only given. A simple method has been developed for analysis of the emission properties of geometrically complex cathodes. The technique is based on the assumption that current from a portion of the cathode surface is space charge limited with the balance being temperature limited. A model for total diode current was created that permits calculation of cathode properties from experimental data. An experiment was run in which the voltage on a charged capacitor was switched across a diode containing a complex finned cathode. Diode current and voltage were measured as a function of time with a high speed digitizer. These tests were repeated for a range of applied voltages and cathode temperatures. Current-vs-voltage data obtained from these measurements were fitted to the model using non-linear regression. The data were found to conform well to the model, showing that 64% of the cathode area was temperature limited at the maximum diode voltage.
         
        
            Keywords : 
electron emission; thermionic cathodes; applied voltages; cathode surface; cathode temperatures; charged capacitor; complex finned cathode; current-vs-voltage data; diode voltage; electron emission; geometrically complex thermionic cathodes; maximum diode voltage; nonlinear regression; space charge limited current; temperature-limited cathode area; total diode current; Capacitors; Cathodes; Current measurement; Diodes; Electron emission; Space charge; Temperature; Thermionic emission; Velocity measurement; Voltage measurement;
         
        
        
        
            Conference_Titel : 
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
         
        
            Conference_Location : 
Raleigh, NC, USA
         
        
        
            Print_ISBN : 
0-7803-4792-7
         
        
        
            DOI : 
10.1109/PLASMA.1998.677807