DocumentCode
1643163
Title
Single electron and few electron memory cells
Author
Ahmed, H.
Author_Institution
Cavendish Lab., Cambridge Univ., UK
fYear
1999
Firstpage
363
Lastpage
366
Abstract
Memory cells based on single electron devices fabricated with silicon technology will be required if the progress of memories to the multi-gigascale together with high speed operation is to be achieved. Single electron charging effects in nanowires of silicon or polysilicon can be coupled to conventional MOSFETs or tunnelling barrier structures can be placed at the gate of the MOSFET to make memory cells. Although some of these structures only work at low temperatures some have also demonstrated room temperature operation.
Keywords
semiconductor storage; single electron transistors; MOSFET; SOISET; Si; few electron memory cell; polysilicon nanowire; silicon technology; single electron charging; single electron device; single electron memory cell; tunnelling barrier structure; Laboratories; MOSFETs; Magnetic tunneling; Nanowires; Oxidation; Silicon on insulator technology; Single electron devices; Single electron transistors; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-5410-9
Type
conf
DOI
10.1109/IEDM.1999.824170
Filename
824170
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