DocumentCode :
1643601
Title :
New qualified industrial AlGaN/GaN HEMT process: Power performances & reliability figures of merit
Author :
Floriot, D. ; Blanck, H. ; Bouw, D. ; Bourgeois, F. ; Camiade, M. ; Favede, L. ; Hosch, M. ; Jung, H. ; Lambert, B. ; Nguyen, Anh ; Riepe, K. ; Splettstosse, J. ; Stieglauer, H. ; Thorpe, Julie ; Meiners, U.
Author_Institution :
United Monolithic Semicond. SAS, Villebon-sur-Yvette, France
fYear :
2012
Firstpage :
317
Lastpage :
320
Abstract :
This paper describes the performances of a new power 0.5 μm gate length AlGaN / GaN HEMT process named GH50_10. This process has been developed to address applications and market needs up to 7 GHz. A specific emphasis has been attached to find a trade- off in between power / efficiency and linearity. After an introduction of the context, a short description of the process manufacturing is given including spread of the DC parameters. From the qualification procedure, key reliability figures of the process are presented like the main energy of activation and an evaluation of the Median Time to Failure, evaluated respectively to 1.95ev and 106 hours at 200°C. Power performances are presented from L to C bands from 15W for the elementary power transistors to 50W for high power packaged transistors. This technology is presently available at industrial level to address products requirements for telecom and military needs. Compliance to space requirement is underway.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; wide band gap semiconductors; AlGaN-GaN; DC parameters; electron volt energy 1.95 eV; elementary power transistors; figures of merit; gate length; industrial HEMT process; power 15 W; power performances; qualification procedure; reliability figures; size 0.5 mum; temperature 200 degC; time 106 hour; trade-off; Aluminum gallium nitride; Gallium nitride; Integrated circuit reliability; Logic gates; Temperature measurement; Transistors; AlGaN/GaN HEMT; power transistor; reliability; robustness; technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2012 7th European
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4673-2302-4
Electronic_ISBN :
978-2-87487-026-2
Type :
conf
Filename :
6483800
Link To Document :
بازگشت