DocumentCode :
1643694
Title :
Advanced static verification for SoC designs
Author :
Yeung, Ping ; Choi, Sea
Author_Institution :
Mentor Graphics Corp., San Jose, CA, USA
fYear :
2009
Firstpage :
295
Lastpage :
300
Abstract :
After a design has been implemented in silicon, it is immensely difficult to debug any functional or silicon related problems. Hence, anything that can be done up-front at the RTL or gate-level to prevent errors will be extremely beneficial. So far, simulation-based dynamic verification has been relied upon heavily to verify the functionality of designs. In this paper, we summarize a number of static verification technologies - from simple RTL lint to sophisticated formal property verification - that can complement dynamic verification. These technologies can also help with low power verification and static timing analysis. Most importantly, they can target silicon related problems - such as clock domain crossing uncertainties, X-states, and uninitialized registers - that cannot be verified with dynamic simulation.
Keywords :
elemental semiconductors; silicon; system-on-chip; RTL; SoC designs; X-states; advanced static verification; clock domain crossing uncertainties; gate-level; low power verification; simulation-based dynamic verification; static timing analysis; system-on-chip; uninitialized registers; Clocks; Counting circuits; Feedback; Graphics; Logic design; Performance analysis; Silicon; Testing; Timing; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SoC Design Conference (ISOCC), 2009 International
Conference_Location :
Busan
Print_ISBN :
978-1-4244-5034-3
Electronic_ISBN :
978-1-4244-5035-0
Type :
conf
DOI :
10.1109/SOCDC.2009.5423785
Filename :
5423785
Link To Document :
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