DocumentCode :
1643756
Title :
A New Security Sensitivity Measurement for Software Variables
Author :
Cheng, Xueqi ; He, Nannan ; Hsiao, Michael S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA
fYear :
2008
Firstpage :
593
Lastpage :
598
Abstract :
As software security becomes increasingly crucial in modern software system, security-oriented software development will become a vital component towards a secure system. Therefore, how to effectively analyze and measure the software security vulnerability during the software development process emerges as an essential problem. In this paper, we propose a new security sensitivity metric for software variables. Unlike the conventional black-box-based approaches, our metric targets at a fine granularity - the variable level. Model checking is applied to check whether any security property is violated when a program variable is influenced by the attack impacts. The security vulnerability of the variable is then calculated as its overall capability of maintaining security properties under malicious external attacks. A case study on stack-based buffer overflow property shows the effectiveness of our measurement in identifying and evaluating the security criticality of different variables in the software.
Keywords :
program testing; program verification; security of data; software fault tolerance; software metrics; black-box-based approach; malicious external attack; model checking; program variable attack; secure software system development; security property violation; security-oriented software development; software security sensitivity measurement; software security sensitivity metric; software security vulnerability measurement; stack-based buffer overflow property; Buffer overflow; Buildings; Computer security; Electric variables measurement; Helium; Open source software; Programming profession; Protection; Software measurement; Software systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Technologies for Homeland Security, 2008 IEEE Conference on
Conference_Location :
Waltham, MA
Print_ISBN :
978-1-4244-1977-7
Electronic_ISBN :
978-1-4244-1978-4
Type :
conf
DOI :
10.1109/THS.2008.4534520
Filename :
4534520
Link To Document :
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