Title :
A new Physical Unclonable Functions based on measuring Power Distribution System resistance variations
Author :
Zhang, JianRui ; Xue, JianFeng
Author_Institution :
Dept. of Electr. Eng., North China Inst. of Aerosp. Eng., Langfang, China
Abstract :
Metal resistance variations in back-end-of-line processes can be significant, particularly during process bring-up. In this paper, I propose a simple method to measure resistance variations in the Power Distribution System (PDS) of an IC, and describe how these measurements can be applied to a Physical Unclonable Function (PUF). By applying a sequence of tests using small on-chip support circuits attached to the PDS, the resistance of components of the PDS can be obtained from the solution to a set of simultaneous equations, and be applied to hardware security by forming a PUF. We demonstrate that this PUF signature can then be used to uniquely identify each IC.
Keywords :
electric resistance measurement; integrated circuit interconnections; integrated circuit measurement; IC power distribution system; PUF signature; hardware security; on-chip support circuit; physical unclonable function; power distribution system resistance variation; simultaneous equation; unclonable function; Electrical resistance measurement; Equations; Integrated circuits; Mathematical model; Resistance; Security; Semiconductor device measurement; PDS; PUF; hardware security; resistantce variations;
Conference_Titel :
Anti-Counterfeiting, Security and Identification (ASID), 2012 International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-2144-0
Electronic_ISBN :
2163-5048
DOI :
10.1109/ICASID.2012.6325290
