Title :
A multi-phase clock design for super high-speed time interleaved analog-to-digital converter
Author :
Gao, Yu-Han ; Wang, Yong-Lu ; Zhang, Zheng-Ping
Author_Institution :
24th Inst., CETC, Chongqing, China
Abstract :
In this paper, we present a multi-phase clock (MPC) which is used in a super high-speed time interleaved analog-to-digital converter (TI ADC). To meet the timing requirements of the whole ADC, timing design between channels must be performed carefully, meanwhile, because the signal-to-noise ratio(SNR) of the whole ADC is restrained to the time-skew and jitter performance of the multi-phase clock, lower these timing errors is very important for TI ADC. We use a shift register based multi-phase generator to implement the multiphase relationship between sub-clocks. Digital calibration of the time-skew of single channel clock and serial peripheral interface (SPI) are adopted to lower timing errors between them further more. As a demonstration, a 4-phase clock is implemented, the presented clock circuit is used in a 8bit 5Gsps TI ADC. The whole TI ADC is implemented using a 0.18μm SiGe BiCMOS process. As a result of test, the whole ADC has a SNR of about 45dB at the input frequency of 495MHZ.
Keywords :
BiCMOS logic circuits; Ge-Si alloys; analogue-digital conversion; calibration; clocks; integrated circuit design; logic design; peripheral interfaces; shift registers; timing jitter; 4-phase clock implementation; MPC; SNR; SPI; SiGe; SiGe BiCMOS process; TI ADC; clock circuit; digital calibration; frequency 495 MHz; input frequency; jitter performance; multiphase clock design; multiphase generator; multiphase relationship; serial peripheral interface; shift register; signal-to-noise ratio; single channel clock; size 0.18 mum; subclocks; super high-speed time interleaved analog-to-digital converter; time-skew performance; timing errors; timing requirements; Calibration; Clocks; Shift registers; Signal to noise ratio; Timing; Timing jitter; SNR; SPI; TI ADC; jitter; multi-phase clock; super high-speed; time-skew;
Conference_Titel :
Anti-Counterfeiting, Security and Identification (ASID), 2012 International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-2144-0
Electronic_ISBN :
2163-5048
DOI :
10.1109/ICASID.2012.6325291