Title :
A novel fault resistant algorithm for Montgomery multiplication
Author :
Ying-jian, Yan ; Wei-wei, Zhu ; Er-peng, Duan ; Zhi-qiang, Li
Author_Institution :
Inst. of Electron. Technol., Inf. Eng. Univ., Zheng Zhou, China
Abstract :
The paper described a novel improved version based on Integrated Operand Scanning (FIOS) algorithm, which would be beneficial to hardware implement in parallel. And a new fault resistant scheme for our proposed algorithm was also shown in this paper via comparing the intermediate variables with those recomputed during idle time. The total cycle maybe reduce by about 40% of original one and the capability of checking errors was proved most attractive.
Keywords :
digital arithmetic; fault tolerant computing; multiplying circuits; parallel processing; redundancy; FIOS algorithm; fault resistant algorithm; integrated operand scanning; montgomery multiplication; time redundancy; Algorithm design and analysis; Fault detection; Hardware; Optimization; Pipeline processing; Pipelines; Redundancy; Fault resistant; Montgomery multiplication; Time redundancy;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
DOI :
10.1109/ICSICT.2010.5667895
