Title :
Surface mount technology heat sinks for D2PAK and D3PAK power semiconductors
Author :
Flynn, E.G. ; Johnston, C.N. ; Lee, S.
Author_Institution :
Aavid Thermal Technol. Inc., Laconia, NH, USA
Abstract :
A new surface mount heat sink has been developed for the D2 PAK and D3PAK components. Experimental and analytical studies have been carried out, characterizing the thermal performance of the components on a printed circuit card with and without the heat sink. The addition of a surface mount heat sink reduces the total thermal resistance of the components as much as a factor of two in forced convection applications, and approximately 20 to 30% in the case of natural convection. This highlights the importance of the thermal path through the card and the component itself. In situations where the conjugate effect of heat transfer is particularly strong as in the present case, the total thermal resistance is not a linear function of heat input as the ratio of heat partition into different paths depends on the amount of total heat dissipation. This non-linear behavior is observed in the measurements and analytical results. It was also revealed through comparisons between the measurements and computed results, that the heat dissipation through the insulating foam under the back surface of the card cannot be ignored
Keywords :
forced convection; heat sinks; natural convection; power semiconductor devices; printed circuits; semiconductor device packaging; surface mount technology; thermal analysis; thermal resistance; D2PAK; D3PAK; PC card mounted devices; SMT heat sinks; forced convection applications; heat transfer; natural convection; nonlinear behavior; power semiconductors; printed circuit card; surface mount technology; thermal path; thermal performance; thermal resistance; total heat dissipation; Electrical resistance measurement; Heat sinks; Heat transfer; Performance analysis; Printed circuits; Resistance heating; Surface resistance; Surface-mount technology; Thermal factors; Thermal resistance;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1997. SEMI-THERM XIII., Thirteenth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3793-X
DOI :
10.1109/STHERM.1997.566791