DocumentCode
1644349
Title
The advanced test system architecture provides fast and accurate test for a high resolution ADC
Author
Maeda, Akinori
fYear
1995
Firstpage
68
Abstract
This work describes the new approach to test the linearity of the high resolution ADCs using the test system which has the advanced architecture. The enhanced linear histogram method is implemented and the very accurate results is obtained. Also the test time is almost half of the ordinary histogram method.
Keywords
Clocks; Delay; Digital signal processing; Histograms; Linearity; Master-slave; Signal generators; Signal resolution; Synchronization; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
Conference_Location
Baltimore, MD
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527805
Filename
527805
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