Bursts of Pulses for time domain large signal measurements

Author

Fara, Jad ; Callet, Guillaume ; De Groote, Fabien ; Verspecht, Jan ; Quere, Raymond ; Teyssier, Jean-Pierre

Author_Institution

Univ. of Limoges, Limoges, France

fYear

2009

Firstpage

1

Lastpage

4

Abstract

An enhanced pulsed mode for RF measurements based on synchronized repetitive signals is proposed, with the unique capability to manage repetitive sets of pulses and consequently to investigate the pulse-to-pulse behavior of high power active devices. This new technology is applied to a sampler-based NVNA (nonlinear vector network analyzers), without any dynamical losses. Burst of pulses measurements of high power AlGaN/GaN transistors are performed in a multi-harmonic passive load-pull environment. Time domain waveforms and S21 pulse-to-pulse phase within the burst are acquired and discussed.

Keywords

III-V semiconductors; aluminium compounds; gallium compounds; network analysers; power transistors; pulse measurement; radiofrequency measurement; wide band gap semiconductors; AlGaN-GaN; NVNA; RF measurements; enhanced pulsed mode; high power transistors; large signal measurements; multiharmonic passive load-pull environment; nonlinear vector network analyzers; power active devices; pulse bursts; pulses measurements; synchronized repetitive signals; time domain waveforms; Dielectric loss measurement; Dielectric measurements; Dielectric substrates; Frequency measurement; Magnetic field measurement; Permittivity measurement; Pulse measurements; Resonance; Tellurium; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Conference, 2009 73rd ARFTG

Conference_Location

Boston, MA

Print_ISBN

978-1-4244-3442-8

Electronic_ISBN

978-1-4244-3443-5

Type

conf

DOI

10.1109/ARFTG.2009.5278067

Filename

5278067